• DocumentCode
    3340725
  • Title

    Advances in high throughput wafer and solar cell technology for EFG ribbon

  • Author

    Kalejs, J. ; Mackintosh, B. ; Schmidt, Werner ; Woesten, B.

  • Author_Institution
    ASE Americas Inc., Billerica, MA, USA
  • fYear
    2002
  • fDate
    19-24 May 2002
  • Firstpage
    74
  • Lastpage
    77
  • Abstract
    Construction of as many as 70 × 100 MW manufacturing facilities in the next two decades is required to address U.S. Photovoltaic Industry Roadmap targets. Effective material utilization, high throughput and yield, improvements in solar cell efficiency, and minimizing the environmental impact of manufacturing waste products are all desirable attributes that must be combined in low cost factory equipment. We discuss how these elements are being addressed with ribbon technology now under development for crystalline silicon wafer production by the Edge-defined Film-fed Growth (EFG) method.
  • Keywords
    crystal growth from melt; elemental semiconductors; semiconductor device manufacture; semiconductor growth; silicon; solar cells; 100 MW; EFG ribbon; Si; edge-defined film-fed growth method; effective material utilization; environmental impact; high throughput wafer technology; low cost factory equipment; manufacturing waste products; solar cell efficiency; solar cell technology; Construction industry; Costs; Crystalline materials; Manufacturing industries; Photovoltaic cells; Photovoltaic systems; Production facilities; Solar power generation; Throughput; Waste materials;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
  • ISSN
    1060-8371
  • Print_ISBN
    0-7803-7471-1
  • Type

    conf

  • DOI
    10.1109/PVSC.2002.1190459
  • Filename
    1190459