• DocumentCode
    3340727
  • Title

    Simulation of complex geometries in GATE

  • Author

    Nollet, Tom ; De Beenhouwer, Jan ; Van Holen, Roel ; Vandenberghe, Stefaan ; Staelens, Steven

  • Author_Institution
    Med. Image & Signal Process. group, Ghent Univ. - IBBT, Ghent, Belgium
  • fYear
    2009
  • fDate
    Oct. 24 2009-Nov. 1 2009
  • Firstpage
    4190
  • Lastpage
    4192
  • Abstract
    Collimator optimization plays an important role in single photon emission computed tomography (SPECT). Nowadays complex geometries are added frequently in new designs and sometimes these geometries have no simple parametric description. The simulation of such a collimator poses a problem if one wants to use the Monte Carlo simulator GATE. A collimator in GATE can only be built using a limited set of parametric descriptions. A solution to this problem is a triangulated approximation of the structure at hand. Therefore, new functionality based on the tessellated solids in Geant4 was added to GATE. It makes the simulation of geometries with an arbitrary complexity possible if the virtual reality modeling language (VRML) description of the triangulated volume is provided. Our method was validated against standard GATE for a single knife edge pinhole collimator. The simulated difference for both sensitivity and resolution for the pinhole is lower than 0.48 % for the highest accuracy of triangulation. The major drawback of the current implementation is the computational complexity which increases linearly with the number of triangles.
  • Keywords
    Monte Carlo methods; collimators; computerised tomography; geometry; optimisation; Geant4; Monte Carlo simulator GATE; SPECT; collimator optimization; complex geometries; pinhole collimator; single photon emission computed tomography; tessellated solids; virtual reality modeling language description; Collimators; Computational complexity; Computational geometry; Computational modeling; Design automation; Monte Carlo methods; Nuclear and plasma sciences; Single photon emission computed tomography; Solid modeling; Virtual reality;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-3961-4
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2009.5402453
  • Filename
    5402453