DocumentCode
3340727
Title
Simulation of complex geometries in GATE
Author
Nollet, Tom ; De Beenhouwer, Jan ; Van Holen, Roel ; Vandenberghe, Stefaan ; Staelens, Steven
Author_Institution
Med. Image & Signal Process. group, Ghent Univ. - IBBT, Ghent, Belgium
fYear
2009
fDate
Oct. 24 2009-Nov. 1 2009
Firstpage
4190
Lastpage
4192
Abstract
Collimator optimization plays an important role in single photon emission computed tomography (SPECT). Nowadays complex geometries are added frequently in new designs and sometimes these geometries have no simple parametric description. The simulation of such a collimator poses a problem if one wants to use the Monte Carlo simulator GATE. A collimator in GATE can only be built using a limited set of parametric descriptions. A solution to this problem is a triangulated approximation of the structure at hand. Therefore, new functionality based on the tessellated solids in Geant4 was added to GATE. It makes the simulation of geometries with an arbitrary complexity possible if the virtual reality modeling language (VRML) description of the triangulated volume is provided. Our method was validated against standard GATE for a single knife edge pinhole collimator. The simulated difference for both sensitivity and resolution for the pinhole is lower than 0.48 % for the highest accuracy of triangulation. The major drawback of the current implementation is the computational complexity which increases linearly with the number of triangles.
Keywords
Monte Carlo methods; collimators; computerised tomography; geometry; optimisation; Geant4; Monte Carlo simulator GATE; SPECT; collimator optimization; complex geometries; pinhole collimator; single photon emission computed tomography; tessellated solids; virtual reality modeling language description; Collimators; Computational complexity; Computational geometry; Computational modeling; Design automation; Monte Carlo methods; Nuclear and plasma sciences; Single photon emission computed tomography; Solid modeling; Virtual reality;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location
Orlando, FL
ISSN
1095-7863
Print_ISBN
978-1-4244-3961-4
Electronic_ISBN
1095-7863
Type
conf
DOI
10.1109/NSSMIC.2009.5402453
Filename
5402453
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