Title :
Test circuit for measuring pulse widths of single-event transients causing soft errors
Author :
Narasimham, B. ; Gadlage, Mattew J. ; Bhuva, Bharat L. ; Schrimpf, Ronald D. ; Massengill, Lloyd W. ; Holman, W. Timothy ; Witulski, Arthur F. ; Galloway, Kenneth F.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN
Abstract :
A novel on-chip test circuit to measure single event transient (SET) pulse widths has been developed and implemented in IBM 130-nm and 90-nm processes for characterizing logic soft errors. Test measurements with energetic ions show transient widths ranging from 100 ps to over 1 ns, comparable to legitimate logic signals in such technologies. Design options to limit the SET pulse width and hence to mitigate soft errors were evaluated with the test circuit to demonstrate the effectiveness of such design techniques.
Keywords :
integrated circuit testing; radiation effects; transients; energetic ions; logic soft errors; on-chip test circuit; pulse width measurement; single event transient pulse width; single-event transients; Circuit testing; Microelectronics; Pulse circuits; Pulse measurements; Space vector pulse width modulation; SER; SET; combinational logic; pulse width; single event; single event transient; soft error;
Conference_Titel :
Microelectronic Test Structures, 2008. ICMTS 2008. IEEE International Conference on
Conference_Location :
Edinburgh
Print_ISBN :
978-1-4244-1800-8
Electronic_ISBN :
978-1-4244-1801-5
DOI :
10.1109/ICMTS.2008.4509329
