• DocumentCode
    3341039
  • Title

    Synthesis and characterization of self-assembled, high aspect ratio nm-scale columnar silicon structures

  • Author

    Azhari, Ayu Wazira ; Goh, B.T. ; Sepeai, Suhaila ; Khairunaz, M. ; Sopian, K. ; Zaidi, Saleem H.

  • Author_Institution
    Solar Energy Res. Inst., Univ. Kebangsaan Malaysia, Bangi, Malaysia
  • fYear
    2013
  • fDate
    16-21 June 2013
  • Abstract
    The aim of this work is to synthesize nm-scale columnar structures in Si principally for solar cell applications. These structures are also desirable as templates for heteroepitaxial growth of SixGe1-x. A nanostructured layer is instrumental in facilitating pseudomorphic heteroepitaxial growth of SixGe1-x layers since it can help reduce lattice mismatch as well as thermal expansion mismatch, thus, leading to Si-based high efficiency solar cells at lower cost. A simple yet promising method was chosen to synthesize randomly distributed, nm-scale columnar structures. This metal assisted chemical etching (MACE) technique uses metal-induced oxidation of silicon to anisotropic trenches. Preliminary results indicate that nm-scale columns as characterized by field emission scanning microscopy (FE-SEM) consist of fine pores running parallel to the wafer surface and deeply etched anisotropic columns perpendicular to the surface. All etching work was carried out on (100) orientation Si wafers. Results indicate strong dependence on solution concentration both in terms of profile and etch rate. Optical characterization based on spectral reflectance and transmission measurements have been employed in characterizing the nm-scale surfaces. Initial studies indicate low reflectance and high absorption with increasing depth of the nanostructures.
  • Keywords
    Ge-Si alloys; elemental semiconductors; epitaxial growth; etching; field emission electron microscopy; infrared spectra; nanofabrication; nanoporous materials; oxidation; porosity; scanning electron microscopy; self-assembly; semiconductor epitaxial layers; semiconductor growth; silicon; solar cells; thermal expansion; ultraviolet spectra; visible spectra; FESEM; Si; SixGe1-x-Si; UV-visible-near infrared spectrometry; anisotropic trenches; field emission scanning microscopy; fine pores; lattice mismatch; metal assisted chemical etching; metal-induced oxidation; nanometerscale columnar structures; optical characterization; pseudomorphic heteroepitaxial growth; self-assembly; silicon germanium layer; silicon structure; silicon-based high efficiency solar cells; solar cell application; solution concentration; spectral reflectance; thermal expansion; transmission measurement; wafer surface; Etching; Hafnium; Photovoltaic cells; Reflectivity; Silicon; Surface morphology; MACE; Si nanopillars; heteroepitaxial growth; self-assembled nanostructures; solar cells;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
  • Conference_Location
    Tampa, FL
  • Type

    conf

  • DOI
    10.1109/PVSC.2013.6744206
  • Filename
    6744206