DocumentCode :
3341051
Title :
Characterization of grain boundary properties in BaSi2 epitaxial films on Si(111) and Si(001) by Kelvin probe force microscopy
Author :
Baba, M. ; Tsurekawa, Sadahiro ; Nakamura, Kentaro ; Du Weijie ; Koike, Shin´ichi ; Toko, Kiyoshi ; Hara, Kosuke O. ; Usami, Noritaka ; Suemasu, Takashi
Author_Institution :
Inst. of Appl. Phys., Univ. of Tsukuba, Tsukuba, Japan
fYear :
2013
fDate :
16-21 June 2013
Abstract :
Grain boundaries (GBs) in a-axis-oriented semiconducting n-BaSi2 epitaxial films on Si(111) and Si(001) grown by molecular beam epitaxy were evaluated using Kelvin probe force microscopy. The GBs of n-BaSi2 on Si(111) has a higher electrostatic potential by approximately 30 meV than the grain interior. Thus, a concave band structure of the valence band minimum (VBM) is assumed and the GBs do not work as recombination centers for minority carriers (holes) in the n-BaSi2. In contrast, the GBs of BaSi2 on Si(001) has a lower electrostatic potential by approximately 50 meV than the grain interior. This means that the GBs have a convex band structure of the VBM, and thus are likely to work as trap centers for holes in n-BaSi2. These results present the difference in the GB character of a-axis-oriented n-BaSi2 epitaxial films, depending on the Si surface used.
Keywords :
barium compounds; elemental semiconductors; grain boundaries; minority carriers; molecular beam epitaxial growth; semiconductor epitaxial layers; silicon; solar cells; BaSi2; Kelvin probe force microscopy; Si; Si(001); Si(111); a-axis-oriented semiconductor; concave band structure; convex band structure; electrostatic potential; epitaxial films; grain boundary properties; grain interior; minority carriers; molecular beam epitaxy; valence band minimum; Electric potential; Electrostatics; Molecular beam epitaxial growth; Silicon; Substrates; KFM; MBE; epitaxy; grain boundary; silicide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
Conference_Location :
Tampa, FL
Type :
conf
DOI :
10.1109/PVSC.2013.6744207
Filename :
6744207
Link To Document :
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