DocumentCode :
3341075
Title :
Notice of Retraction
Studying the Activity of Vanadium SCR Catalysts with the Doping of Nickel
Author :
Youhong Xiao ; Xinna Tian ; Yongwei Cheng
Author_Institution :
Coll. of Power & Energy Eng., Harbin Eng. Univ., Harbin, China
fYear :
2011
fDate :
10-12 May 2011
Firstpage :
1
Lastpage :
4
Abstract :
Notice of Retraction

After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE´s Publication Principles.

We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper.

The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org.

Selective catalytic reduction (SCR) systems have been applied for NOx emission control for over a decade. Most current SCR systems use V2O5 as a catalyst for reaction of ammonia with NOx to form nitrogen and water. Although the NOx reduction efficiency of current SCR systems has reached to 95%, the reaction has a limited range of operation temperature, i.e. 300-400°C which has caused a de-rated performance of the systems when engine exhaust temperature is low.The paper presents the results of a study on vanadium supported on ceramic honeycomb substrate with the doping of nickel to investigate the low temperature performance of exiting SCR systems. The study also includes preparation, activity tests and characterization of the selected catalysts. Results show that an effective conversion of NOx can be achieved the temperature of 250°C by adding Ni.
Keywords :
doping; nickel; NOx; Ni; V2O5; ammonia; ceramic honeycomb substrate; emission control; engine exhaust temperature; nickel doping; selective catalytic reduction system; temperature 250 C; temperature 300 C to 400 C; vanadium SCR catalysts; Ceramics; Loading; Nickel; Substrates; Thyristors; X-ray scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Bioinformatics and Biomedical Engineering, (iCBBE) 2011 5th International Conference on
Conference_Location :
Wuhan
ISSN :
2151-7614
Print_ISBN :
978-1-4244-5088-6
Type :
conf
DOI :
10.1109/icbbe.2011.5781275
Filename :
5781275
Link To Document :
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