Title :
Intracranial pressure instability: analysis with a simple mathematical model
Author :
Ursino, Mauro ; Lodi, Carlo Albedo
Author_Institution :
Dipt. di Elettronica Inf. e Sistemistica, Bologna Univ., Italy
fDate :
31 Oct-3 Nov 1996
Abstract :
A simple mathematical model of intracranial pressure (ICP) dynamics is presented. It incorporates the main factors which are known to affect ICP in the short period, i.e., the cerebrospinal fluid (CSF) circulation, the nonlinear craniospinal compliance and the active cerebral blood volume changes induced by autoregulation. The model is used to study the stability of ICP dynamics in pathological conditions. Analysis of model eigenvalues and of bifurcation diagrams reveals that intracranial dynamics becomes unstable in pathological conditions characterized by a decrease in craniospinal compliance and a decrease in CSF outflow. Computer simulations show that the lose of stability manifests itself through a paradoxical ICP response to small initial perturbations and, in the more severe cases, with large-amplitude self sustained waves (plateau waves). All the previous results agree with those reported in the clinical literature
Keywords :
biological fluid dynamics; brain models; digital simulation; haemodynamics; physiological models; active cerebral blood volume changes; autoregulation; bifurcation diagrams; cerebrospinal fluid circulation; clinical literature; craniospinal compliance; intracranial pressure dynamics; intracranial pressure instability; large-amplitude self sustained waves; model eigenvalues; nonlinear craniospinal compliance; paradoxical response; pathological conditions; plateau waves; simple mathematical model; small initial perturbations; Blood; Cranial pressure; Diseases; Eigenvalues and eigenfunctions; Equations; Fluid dynamics; Immune system; Mathematical model; Pathology; Stability;
Conference_Titel :
Engineering in Medicine and Biology Society, 1996. Bridging Disciplines for Biomedicine. Proceedings of the 18th Annual International Conference of the IEEE
Conference_Location :
Amsterdam
Print_ISBN :
0-7803-3811-1
DOI :
10.1109/IEMBS.1996.646260