DocumentCode
3341139
Title
Influence of chemical annealing on electronic properties of a-(Si, Ge)
Author
Zhao Li ; Dalal, Vikram L.
Author_Institution
Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA
fYear
2013
fDate
16-21 June 2013
Abstract
Hydrogenated amorphous Silicon-Germanium alloy [a-(Si, Ge):H]remains an important material with applications for solar cells and detectors. In this paper, we show that the properties of the materials and devices can be significantly improved by using chemical annealing, or layer-by-layer growth, where one grows a thin layer followed by controlled hydrogen ion bombardment, and then repeats the process. The properties measured include H bonding, photo-conductivity, electron and hole mobility-lifetime products and p-i-n solar cell device properties. We also measured the stability of solar cells subjected to light soaking and find significant improvements in stability for chemically annealed devices compared to devices produced using normal, continuous growth. The improvement in stability and electronic properties is ascribed to an improved hydrogen microstructure produced in the material due to chemical annealing as indicated by an examination of the infrared absorption in the films.
Keywords
Ge-Si alloys; amorphous semiconductors; annealing; crystal microstructure; electron mobility; hole mobility; hydrogen; hydrogen bonds; infrared spectra; photoconductivity; semiconductor thin films; solar cells; Si-Ge:H; chemical annealing; detectors; electron mobility; electronic properties; hole mobility-lifetime; hydrogen bonding; hydrogen ion bombardment; hydrogen microstructure; hydrogenated amorphous silicon-germanium alloy; infrared absorption; layer-by-layer growth; p-i-n solar cell; photoconductivity; thin films; Annealing; Bonding; Chemicals; Films; Microstructure; Photovoltaic cells; amorphous materials; photovoltaic cells; silicon-germanium alloy; stability;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
Conference_Location
Tampa, FL
Type
conf
DOI
10.1109/PVSC.2013.6744210
Filename
6744210
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