Title :
Space charges induced in polymers by electron beam irradiation and their decay profiles
Author :
Tomite, Naoto ; Arai, Yutaro ; Ohki, Y. ; Nakmura, Hirotaka ; Hinata, Toshifumi ; Washio, M.
Author_Institution :
Dept. of Electr. Eng. & Biosci., Waseda Univ., Tokyo, Japan
fDate :
June 30 2013-July 4 2013
Abstract :
Electrons were irradiated to low-density polyethylene (LDPE), polyimide (PI), polyethylene terephthalate (PET), polyethylene naphthalate (PEN) and syndiotactic polystyrene (SPS). Many electrons were back scattered and large numbers of electrons and holes were generated in the film by ionization. Since the amount of negative charge observed under short-circuit after the irradiation is significantly smaller than the electron fluence, most electrons and holes generated by the irradiation were either recombined or transported to the electrodes. The amount of negative charge gradually decreases monotonically, showing the order of the decay speed, PI > LDPE > PET > SPS > PEN. The conductivity also shows the same order. When a dc voltage is applied to the sample, in which electrons and holes were generated abundantly by ionization, the electric field is enhanced significantly at the two electrodes due to the presence of positive charge near the cathode and negative charge near the anode.
Keywords :
insulating materials; ionisation; polyethylene insulation; polymers; radiation effects; space charge; LDPE; PEN; PET; SPS; anode; cathode; conductivity; dc voltage; decay profiles; decay speed; electrodes; electron beam irradiation; electrons; holes; insulating polymers; ionization; low-density polyethylene; negative charge; polyethylene naphthalate; polyethylene terephthalate; polyimide; polymers; positive charge; short-circuit; space charges; syndiotactic polystyrene; Cathodes; Conductivity; Electric fields; Films; Positron emission tomography; Radiation effects; Space charge; conductivity; electron beam; insulating material; space charge;
Conference_Titel :
Solid Dielectrics (ICSD), 2013 IEEE International Conference on
Conference_Location :
Bologna
Print_ISBN :
978-1-4799-0807-3
DOI :
10.1109/ICSD.2013.6619737