DocumentCode :
3341332
Title :
Advances in the generation of deformation time series from SAR data sequences in areas affected by large dynamics
Author :
Casu, Francesco ; Manconi, Andrea ; Pepe, Antonio ; Manzo, Mariarosaria ; Lanari, Riccardo
Author_Institution :
IREA-CNR, Napoli, Italy
fYear :
2010
fDate :
25-30 July 2010
Firstpage :
2618
Lastpage :
2621
Abstract :
We propose advances on the generation of deformation time series in areas affected by large deformation dynamics, where the exploitation of the differential SAR phase can be strongly limited by severe misregistration errors or by very high fringe rates. First, to overcome the former issue, we present an extension of the amplitude-based Pixel-Offset (PO) analyses by applying the Small BAseline Subset (SBAS) strategy, in order to move from the investigation of single (large) deformation events to that of dynamic phenomena. Secondly, to handle the high fringe rate interferograms, we subtract from them properly generated synthetic deformation models allowing us to reduce the fringe rate, thus helping the phase unwrapping step. The proposed approaches have been tested on ASAR-ENVISAT data acquired on Galápagos Islands and validated via continuous GPS measurements.
Keywords :
deformation; synthetic aperture radar; time series; ASAR-ENVISAT data; Galapagos Islands; SAR data sequences; amplitude-based pixel-offset analyses; continuous GPS measurements; deformation events; deformation time series generation; differential SAR phase; dynamic phenomena; high fringe rate interferograms; large deformation dynamics; misregistration errors; phase unwrapping step; small baseline subset strategy; synthetic deformation models; very high fringe rates; Data models; Deformable models; Extraterrestrial measurements; Global Positioning System; Pixel; Synthetic aperture radar; Time series analysis; DInSAR; Galápagos Islands; SAR Pixel-Offset; SBAS; Synthetic Deformation Models;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Geoscience and Remote Sensing Symposium (IGARSS), 2010 IEEE International
Conference_Location :
Honolulu, HI
ISSN :
2153-6996
Print_ISBN :
978-1-4244-9565-8
Electronic_ISBN :
2153-6996
Type :
conf
DOI :
10.1109/IGARSS.2010.5651926
Filename :
5651926
Link To Document :
بازگشت