• DocumentCode
    3341466
  • Title

    Learning to appreciate the maxim “less is more”

  • Author

    Smith, Colin ; Nghia Nguyen ; Liming Ji ; Wook Jun Nam ; Fonash, Stephen

  • Author_Institution
    Dept. of Eng. Sci. & Mech., Pennsylvania State Univ., University Park, PA, USA
  • fYear
    2013
  • fDate
    16-21 June 2013
  • Abstract
    We present the profound performance enhancements experienced when an ultra-thin nanocrystalline silicon (nc-Si) film is utilized in our light and carrier collection management (LCCM) architecture (US Patent 8,294,025). We begin by establishing theoretical short circuit current density (Jsc) values for planar nc-Si devices. Numerical simulation results for the same thicknesses conformally coated over nano-element arrays are then given. Jsc values above 30mA/cm2 are shown for the nc-Si LCCM cells for nc-Si films as thin as 200nm. To attain a Jsc of 35.5mA/cm2, the LCCM solar cell architecture reduces the required nc-Si volume by 98.3% compared to the planar solar cell that would match that performance. The minimization of material while maximizing performance has obvious implications for cost/watt savings. The architectural dimensions that are the product of this study are invaluable for cell manufacturing.
  • Keywords
    elemental semiconductors; nanostructured materials; semiconductor thin films; short-circuit currents; silicon; solar cell arrays; LCCM solar cell architecture; Si; cell manufacturing; cost-watt savings; light and carrier collection management; material minimization; nanoelement arrays; nc-silicon devices; numerical simulation; theoretical short circuit current density; ultra-thin nanocrystalline silicon film; Computer architecture; Films; Manufacturing; Photovoltaic cells; Photovoltaic systems; Silicon; nanoscale devices; numerical simulation; photovoltaic cells; silicon; thin films;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
  • Conference_Location
    Tampa, FL
  • Type

    conf

  • DOI
    10.1109/PVSC.2013.6744227
  • Filename
    6744227