• DocumentCode
    3341478
  • Title

    Electro-thermal and Logi-thermal Simulators aimed at the Temperature-aware Design of Complex Integrated Circuits

  • Author

    Poppe, András ; Horváth, György ; Nagy, Gergely ; Rencz, Márta ; Székely, Vladimír

  • Author_Institution
    Dept. of Electron Devices, Budapest Univ. of Technol. & Econ., Budapest
  • fYear
    2008
  • fDate
    16-20 March 2008
  • Firstpage
    68
  • Lastpage
    76
  • Abstract
    With the increasing power dissipation increasing attention has been paid to the thermal issues in electronics design on system, board, package and chip level, including electrothermal simulation of even rather complex integrated circuits. Two distinct algorithmic directions can be distinguished in electro-thermal simulation: the simulator coupling and the simultaneous iteration or direct method. In our view the direct method is well suited for electro-thermal simulation of analog circuit blocks while simulator coupling can be used to implement logi-thermal simulation. In case of complex designs containing digital and analog blocks the two approaches can also be combined. Ideally thermal, electro-thermal and logi-thermal simulation of a circuit is performed already in the phase of conceptual design when only a rough idea exists about the final physical realization of the circuit. In any case, effect of the thermal boundary conditions of the die+package, cooling via the electrical connections to the die and the granularity of the simulation should be carefully considered.
  • Keywords
    circuit simulation; integrated circuit design; logic circuits; thermal analysis; analog circuit blocks; electronics design; electrothermal simulation; electrothermal simulator; logithermal simulator; power dissipation; simulator coupling; temperature-aware design of complex integrated circuits; CMOS image sensors; Circuit simulation; Coupling circuits; Diodes; Dynamic range; Electronic packaging thermal management; Electrothermal effects; Sensor arrays; Temperature dependence; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium, 2008. Semi-Therm 2008. Twenty-fourth Annual IEEE
  • Conference_Location
    San Jose, CA
  • ISSN
    1065-2221
  • Print_ISBN
    978-1-4244-2123-7
  • Electronic_ISBN
    1065-2221
  • Type

    conf

  • DOI
    10.1109/STHERM.2008.4509369
  • Filename
    4509369