• DocumentCode
    3341499
  • Title

    Modeling and Validation of On-Die Cooling of Dual-Core CPU using Embedded Thermoelectric Devices

  • Author

    Alley, Randy ; Soto, Marco ; Kwark, Leon ; Crocco, Paul ; Koester, David

  • Author_Institution
    Nextreme Thermal Solutions, Inc., Durham, NC
  • fYear
    2008
  • fDate
    16-20 March 2008
  • Firstpage
    77
  • Lastpage
    82
  • Abstract
    Today\´s high density processor circuits produce areas of high heat flux which can impose a thermal ceiling on product performance. Chip scale cooling solutions unnecessarily add to the heat sink load by cooling low heat flux areas in addition to the critical localized high heat flux areas (hot spots). In this paper, we demonstrate that embedded thermoelectric cooling (eTEC) technology can be used to significantly lower processor core operating temperatures by focusing the cooling directly on the hottest region. The demonstration vehicle used for this work was the Intel mobile Core 2 Duo, code-named "Merom", the mobile version of Intel\´s Conroe desktop CPU. Merom utilizes two processor cores that generate localized areas of high heat flux, and as such is ideally suited to demonstrate the benefits of eTEC integration. The Merom chip is available in bare die form, which allowed the eTEC to be integrated onto an external heat spreader and subsequently attached to the CPU. Use of this localized cooling approach and a properly integrated eTEC, provided sustained processor core temperature reductions of between 5degC and 6degC. These cooling results are achieved using a solid-state technology with the associated benefits of manufacturing efficiency, and quiet, reliable operation.
  • Keywords
    cooling; microprocessor chips; thermoelectric devices; Conroe desktop CPU; Intel mobile Core 2 Duo; Merom code; dual-core CPU circuits; embedded thermoelectric cooling technology; on-die cooling; solid-state technology; thermal ceiling; Boundary conditions; Central Processing Unit; Circuits; Cooling; Equations; Heat sinks; Reduced order systems; Temperature; Thermoelectric devices; Thermoelectricity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium, 2008. Semi-Therm 2008. Twenty-fourth Annual IEEE
  • Conference_Location
    San Jose, CA
  • ISSN
    1065-2221
  • Print_ISBN
    978-1-4244-2123-7
  • Electronic_ISBN
    1065-2221
  • Type

    conf

  • DOI
    10.1109/STHERM.2008.4509370
  • Filename
    4509370