• DocumentCode
    3341762
  • Title

    Curvature analysis of pattern transformation manifolds

  • Author

    Vural, Elif ; Frossard, Pascal

  • Author_Institution
    Signal Process. Lab. - LTS4, Ecole Polytech. Fed. de Lausanne (EPFL), Lausanne, Switzerland
  • fYear
    2010
  • fDate
    26-29 Sept. 2010
  • Firstpage
    2689
  • Lastpage
    2692
  • Abstract
    Transformation manifolds are quite attractive for image analysis applications that require transformation invariance properties. The geometric structure of a transformation manifold has a profound influence on the design of processing algorithm, and the curvature is a major parameter in the characterization of the manifold geometry. We propose here a procedure for the computation of an upper bound for the maximum principal curvature of a pattern transformation manifold. We provide an analytical formulation of the curvature bound and show that the numerical computation of this bound is mostly dependent on the rotation parameters. Experimental results indicate that the curvature bound of the manifold has considerable dependence on the spatial complexity and smoothness of the generating pattern. Moreover, experiments with discretization of manifolds suggest that the curvature of the manifold is likely to affect the accuracy of compact representation and sampling algorithms.
  • Keywords
    computational geometry; image processing; discretization; image analysis; maximum principal curvature analysis; numerical computation; pattern smoothness; pattern transformation manifolds; rotation parameters; sampling algorithms; spatial complexity; Dictionaries; Eigenvalues and eigenfunctions; Face; Manifolds; Upper bound; Vectors; Visualization; Pattern transformation manifolds; Riemannian manifolds; principal curvature; transformation-invariance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing (ICIP), 2010 17th IEEE International Conference on
  • Conference_Location
    Hong Kong
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4244-7992-4
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2010.5651945
  • Filename
    5651945