• DocumentCode
    3341942
  • Title

    AFM tip on-line positioning by using the landmark in nano-manipulation

  • Author

    Yuan, Shuai ; Liu, Lianqing ; Wang, Zhidong ; Xi, Ning ; Wang, Yuechao ; Dong, Zaili ; Wang, Zhiyu

  • fYear
    2010
  • fDate
    12-15 Oct. 2010
  • Firstpage
    75
  • Lastpage
    80
  • Abstract
    AFM has been proved to be a powerful nano-manipulation tool taking advantage of its ultra high resolution and precision. However the large spatial uncertainties associated with AFM tip positioning dual to the PZT nonlinearity and thermal drift are still challenging problems, which hinders its wide application especially in building complex structures In this paper, a probabilistic approach combined with the Kalman filter based localization algorithm is proposed to improve the accuracy of the tip positioning in the task space coordinate frame. A motion model based on the Prandtl-Ishlinskii (PI) model is established, the distribution of model error is statistically obtained through the experimental calibration process. In addition, to further reduce the tip position uncertainties, an environment measurement models is developed through sensing the landmark intermittently with local scanning method during manipulation. Both the simulations results and experimental results are presented to demonstrate the validity of the proposed method.
  • Keywords
    Kalman filters; atomic force microscopy; nanopositioning; AFM tip on-line positioning; Kalman filter; PZT nonlinearity; Prandtl-Ishlinskii model; complex structures; environment measurement models; experimental calibration process; localization algorithm; model error distribution; nanomanipulation tool; spatial uncertainties; task space coordinate frame; thermal drift; ultra high resolution; Accuracy; Kalman filters; Motion measurement; Nanobioscience; Position measurement; Probabilistic logic; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology Materials and Devices Conference (NMDC), 2010 IEEE
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    978-1-4244-8896-4
  • Type

    conf

  • DOI
    10.1109/NMDC.2010.5651954
  • Filename
    5651954