DocumentCode
3341994
Title
Separation of bulk diffusion length and rear surface recombination velocity in SR-LBIC mappings
Author
Isenberg, J. ; Bartels, O. ; Warta, W.
Author_Institution
Fraunhofer ISE, Freiburg, Germany
fYear
2002
fDate
19-24 May 2002
Firstpage
328
Lastpage
331
Abstract
SR-LBIC measurements are an important tool for mapping effective diffusion lengths of processed solar cells. This paper investigates the extraction of bulk diffusion length and back surface recombination velocities from SR-LBIC data. Two models for fitting data are studied, one of which takes account for a physical model proposed by Basore (1993), the other one, Spiegel et al. (2000), is a simplification thereof. Simulations with varying noise levels show, that noise is a more severe problem for Lbulk and Sback mappings as compared to Leff mappings, though it should be possible to generate Lbulk and Sback mappings, if the noise level is below approximately 3%. First results of SR-LBIC data analysed with this tool are presented showing the necessity of having at least one measurement at a wavelength that corresponds to a penetration depth around half of the cell thickness.
Keywords
OBIC; carrier lifetime; semiconductor device noise; solar cells; SR-LBIC mappings; bulk diffusion length; effective diffusion length; noise; penetration depth; rear surface recombination velocity; solar cells; Absorption; Data analysis; Data mining; Length measurement; Noise level; Noise measurement; Photovoltaic cells; Solar power generation; Testing; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
ISSN
1060-8371
Print_ISBN
0-7803-7471-1
Type
conf
DOI
10.1109/PVSC.2002.1190525
Filename
1190525
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