• DocumentCode
    3342045
  • Title

    Using broad-band irradiance data to model the short circuit response of aSi modules

  • Author

    Beyer, Hans Georg ; Saetre, Tor Oskar ; Yordanov, Georgi Hristov

  • Author_Institution
    Dept. of Eng., Univ. of Agder, Grimstad, Norway
  • fYear
    2013
  • fDate
    16-21 June 2013
  • Abstract
    aSi modules show large variations in their response to the incoming irradiance as measured by broad-band irradiance sensors, making the check and prediction of their performance difficult when only broad-band data are available. One approach to overcome this difficulty is given by the use of detailed models to estimate the irradiance spectra from the broad-band data. Here, it is tested to what degree the detailed modeling could be substituted by a semi-empirical approach to reflect the modules response based on but the information on direct and diffuse irradiance and solar geometry. The model performance is measured by its capability to give the correct monthly mean short-circuit current together with a reasonable R2 value of the scatter of modeled and measured data. A first test of a respective model has shown reasonable results.
  • Keywords
    amorphous semiconductors; optical sensors; short-circuit currents; silicon; solar cells; PV modules; Si; aSi modules; amorphous silicon; broad-band irradiance sensors; irradiance spectra; semiempirical approach; short-circuit current; solar geometry; Atmospheric modeling; Broadband communication; Current measurement; Data models; Educational institutions; Integrated circuit modeling; Short-circuit currents; amorphous silicon; short-circuit current;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
  • Conference_Location
    Tampa, FL
  • Type

    conf

  • DOI
    10.1109/PVSC.2013.6744258
  • Filename
    6744258