Title :
Control charts and efficient sampling methodologies in the field of photovoltaics
Author :
Allebe, C. ; Govaerts, B. ; Van Kerschaver, E. ; De Wolf, S. ; Szlufcik, I.
Author_Institution :
IMEC vzw, Heverlee, Belgium
Abstract :
Industries must have their process under control in order to become more performant. This is true in particular for the photovoltaic (PV) industry. A Statistical Process Control (SPC) study has been realised for the semi-industrial process at IMEC. In these circumstances control charts have been built and sampling schemes have been investigated. It has been found to be powerful to detect special causes of variation and will still be used in the future for early detection of out of control situations.
Keywords :
photovoltaic cells; semiconductor device manufacture; semiconductor device measurement; solar cells; statistical process control; Statistical Process Control study; control charts; efficient sampling methodologies; photovoltaics; semi-industrial process; Analysis of variance; Control charts; Event detection; Photovoltaic cells; Probability; Process control; Sampling methods; Statistical analysis; Statistics; Wavelength measurement;
Conference_Titel :
Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
Print_ISBN :
0-7803-7471-1
DOI :
10.1109/PVSC.2002.1190540
