• DocumentCode
    3342531
  • Title

    Dielectric relaxation and electric conductivity: Modelling and time domain measurements

  • Author

    Meriem, Abdelguerfi ; Achour, Soualmia

  • Author_Institution
    Lab. de Spectrosc. Dielectrique, USTHB, Algiers, Algeria
  • fYear
    2013
  • fDate
    June 30 2013-July 4 2013
  • Firstpage
    1064
  • Lastpage
    1067
  • Abstract
    In a previous paper (ICSD 2010 Potsdam) we proposed a theoretical model to highlight the appearance of the dipolar relaxation and the appearance of the electrical conductivity in dielectric materials. For this we used spectroscopic techniques in time domain we recall very briefly below. In this paper we verify the proposed model with experimental results which seem to be in agreement We also recall that our model is based on the assumption that migration of charges gives rise to dielectric losses due to the conductivity while dipole orientation gives rise to dielectric losses by relaxation process that is a result of the dipole alignment in the applied field direction. We used samples that have same appearance in their dipole relaxation but differ on their conductive behavior and vice versa in the case where samples are characterized by the same conductive appearance but differ in their mode of relaxation.
  • Keywords
    dielectric losses; dielectric materials; dielectric relaxation; electrical conductivity; time-domain analysis; charge migration; conductive behavior; dielectric loss; dielectric materials; dielectric relaxation; dipolar relaxation; dipole alignment; dipole orientation; dipole relaxation; electric conductivity; relaxation process; spectroscopic techniques; time-domain measurement; Conductivity; Conductivity measurement; Dielectric measurement; Dielectrics; Permittivity; Time-domain analysis; Permittivity; conductivity; relaxation; time domain reflectometry;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid Dielectrics (ICSD), 2013 IEEE International Conference on
  • Conference_Location
    Bologna
  • ISSN
    2159-1687
  • Print_ISBN
    978-1-4799-0807-3
  • Type

    conf

  • DOI
    10.1109/ICSD.2013.6619801
  • Filename
    6619801