DocumentCode
3342531
Title
Dielectric relaxation and electric conductivity: Modelling and time domain measurements
Author
Meriem, Abdelguerfi ; Achour, Soualmia
Author_Institution
Lab. de Spectrosc. Dielectrique, USTHB, Algiers, Algeria
fYear
2013
fDate
June 30 2013-July 4 2013
Firstpage
1064
Lastpage
1067
Abstract
In a previous paper (ICSD 2010 Potsdam) we proposed a theoretical model to highlight the appearance of the dipolar relaxation and the appearance of the electrical conductivity in dielectric materials. For this we used spectroscopic techniques in time domain we recall very briefly below. In this paper we verify the proposed model with experimental results which seem to be in agreement We also recall that our model is based on the assumption that migration of charges gives rise to dielectric losses due to the conductivity while dipole orientation gives rise to dielectric losses by relaxation process that is a result of the dipole alignment in the applied field direction. We used samples that have same appearance in their dipole relaxation but differ on their conductive behavior and vice versa in the case where samples are characterized by the same conductive appearance but differ in their mode of relaxation.
Keywords
dielectric losses; dielectric materials; dielectric relaxation; electrical conductivity; time-domain analysis; charge migration; conductive behavior; dielectric loss; dielectric materials; dielectric relaxation; dipolar relaxation; dipole alignment; dipole orientation; dipole relaxation; electric conductivity; relaxation process; spectroscopic techniques; time-domain measurement; Conductivity; Conductivity measurement; Dielectric measurement; Dielectrics; Permittivity; Time-domain analysis; Permittivity; conductivity; relaxation; time domain reflectometry;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid Dielectrics (ICSD), 2013 IEEE International Conference on
Conference_Location
Bologna
ISSN
2159-1687
Print_ISBN
978-1-4799-0807-3
Type
conf
DOI
10.1109/ICSD.2013.6619801
Filename
6619801
Link To Document