SunPower´s Maxeon Gen III solar cell: High efficiency and energy yield

Author

Smith, David D. ; Cousins, Peter J. ; Masad, Asnat ; Westerberg, Simon ; Defensor, Michael ; Ilaw, Reynold ; Dennis, Tasshi ; Daquin, Rhea ; Bergstrom, Niklas ; Leygo, Arjelene ; Xi Zhu ; Meyers, Bennet ; Bourne, Ben ; Shields, M. ; Rose, D.

Author_Institution

SunPower Corp., San Jose, CA, USA

fYear

2013

fDate

16-21 June 2013

Abstract

SunPower is currently shipping the highest efficiency commercial solar panel in the 20% efficiency E-series with high reliability, and proven high energy yield per rated watt [1,2]. This paper discusses the next generation SunPower solar cell, the Maxeon Gen III used in the recently launched X-series modules. Higher efficiency, improved field performance from lower temperature coefficient, improved reliability due to low reverse breakdown voltage and a uniform dark appearance are the characteristics of this technology. The SunPower Maxeon Gen III solar cell is a high efficiency design intended to reduce cost throughout the value chain by improved performance. The improved efficiency is due to a passivated contact structure lowering the cell emitter recombination to approximately 15 fA/cm² [3]. The process is currently in full scale manufacturing at approximately 100 MW per year in the SunPower´s Fab2 production facility in the Philippines.

Keywords

cost reduction; reliability; solar cells; E-series; Philippines; SunPower Fab2 production facility; SunPower Maxeon Gen III solar cell; X-series modules; cell emitter recombination; commercial solar panel; cost reduction; energy yield; next generation SunPower solar cell; passivated contact structure; reliability; reverse breakdown voltage; uniform dark appearance; Current measurement; Electric breakdown; Photovoltaic cells; Production; Short-circuit currents; Silicon; Temperature measurement; Photovoltaic cells; Silicon; passivation; reverse bias; temperature coefficient;

fLanguage

English

Publisher

ieee

Conference_Titel

Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th

Conference_Location

Tampa, FL

Type

conf

DOI

10.1109/PVSC.2013.6744291

Filename

6744291