Title :
Highly transparent and conductive p-type microcrystalline silicon carbide window layers for thin film silicon solar cells
Author :
Tao Chen ; Kohler, Fabian ; Heidt, Alexander ; Carius, Reinhard ; Finger, Friedhelm
Author_Institution :
IEK-5 Photovoltaik, Forschungszentrum Julich, Jülich, Germany
Abstract :
Transparent and conductive microcrystalline silicon carbide (μc-SiC:H) thin films are an excellent window layer for thin film solar cells. For amorphous silicon based solar cells, p-type conductive μc-SiC:H window layers were deposited by the hot-wire chemical vapor deposition (HWCVD) technique. Monomethylsilane (MMS) highly diluted in hydrogen was used as the SiC source in favor of SiC deposition in a stoichiometric form. Aluminum (Al) introduced from Trimethylaluminum (TMAl) was used as the p-type dopant. In this report, the optoelectronic properties of p-type μc-SiC:H thin films prepared with different deposition pressure and filament temperature were investigated. By managing the deposition parameters, materials with optical gap E04 ranging from 2.0 eV to 2.8 eV and dark conductivity ranging from 10-5 S/cm to 0.1 S/cm were prepared. Such p-type μc-SiC:H thin films were applied as the window layer in amorphous silicon thin film silicon solar cells. Taking advantage of the high transparency of μc-SiC:H window layer, improved quantum efficiency was obtained at the short wavelength below 500 nm.
Keywords :
amorphous semiconductors; chemical vapour deposition; conducting materials; dark conductivity; hydrogen; semiconductor thin films; silicon compounds; solar cells; stoichiometry; thin film devices; wide band gap semiconductors; Al; HWCVD technique; MMS; SiC:H; TMAl; amorphous silicon thin film silicon solar cells; conductive p-type microcrystalline silicon carbide window layers; deposition pressure; electron volt energy 2.0 keV to 2.8 keV; filament temperature; highly transparent silicon carbide window layers; hot-wire chemical vapor deposition technique; monomethylsilane; optical gap E04; optoelectronic property; p-type conductive window layers; p-type dopant; stoichiometric form; thin film silicon solar cells; trimethylaluminum; Conductivity; Optical films; Photovoltaic cells; Silicon carbide; Temperature measurement; Material properties; Photovoltaic cells; Silicon; Silicon carbide; Thin films;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
Conference_Location :
Tampa, FL
DOI :
10.1109/PVSC.2013.6744293