• DocumentCode
    3342845
  • Title

    Thermoelectric properties of rf-sputtered CoSb3 films

  • Author

    Anno, H. ; Matsubara, K ; Notohara, Y. ; Sakakibara, T. ; Kishimoto, K. ; Koyanagi, T.

  • Author_Institution
    Sci. Univ. of Tokyo, Japan
  • fYear
    1996
  • fDate
    26-29 March 1996
  • Firstpage
    435
  • Lastpage
    439
  • Abstract
    Film growth and electronic transport properties of CoSb/sub 3/ with the cubic skutterudite structure were studied. The skutterudite CoSb/sub 3/ films were successfully grown on Si(100) and quartz substrates by using a magnetron rf-sputtering. A preferential orientation growth along [310] plane occurs when the pressure of sputtering gas decreases. Polycrystalline films with the skutterudite structure are also obtained by annealing sputtered films at low temperature. Electrical conductivity of the films changes with the film growth conditions. Electronic structure of the films was investigated by X-ray photoelectron spectroscopy. Observed valence band structure agrees well with a recent band calculation. It is revealed that the valence band structure of CoSb, consists of the hybridized bands between Co d and Sb p states and a peak structure derived from localized Co d state.
  • Keywords
    X-ray photoelectron spectra; annealing; cobalt compounds; crystal orientation; electrical conductivity; electronic structure; semiconductor thin films; sputtered coatings; thermoelectricity; valence bands; CoSb/sub 3/; X-ray photoelectron spectroscopy; annealing; cubic skutterudite structure; electronic structure; electronic transport properties; film growth; hybridized bands; localized Co d state; peak structure; polycrystalline films; preferential orientation growth; rf-sputtered CoSb/sub 3/ films; thermoelectric properties; Annealing; Argon; Lattices; Optical films; Powders; Semiconductor films; Substrates; Temperature; Thermoelectricity; X-ray diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermoelectrics, 1996., Fifteenth International Conference on
  • Conference_Location
    Pasadena, CA, USA
  • Print_ISBN
    0-7803-3221-0
  • Type

    conf

  • DOI
    10.1109/ICT.1996.553522
  • Filename
    553522