DocumentCode
3342868
Title
Empirical multiple energy calibration (EMEC) for material-selective CT
Author
Maass, Nicole ; Sawall, Stefan ; Knaup, Michael ; Kachelriess, Marc
Author_Institution
Friedrich-Alexander-Univ. of Erlangen-Nurnberg (FAU), Erlangen, Germany
fYear
2011
fDate
23-29 Oct. 2011
Firstpage
4222
Lastpage
4229
Abstract
Multiple energy CT may become widely available due to the technological advances of photon-counting energy-selective x-ray detectors. Dual energy imaging allows to provide images of the photo effect and the Compton effect or linear combinations therefrom (basismaterials). With photon-counting energy-selective x-ray detectors the number of energy bins can be increased and one may want to additionally image one or more contrast agent with K-edges. We propose the empirical multiple energy calibration method (EMEC). It determines all spectral properties necessary for material-selective CT imaging from a single measurement of a calibration phantom. In the special cases of only one material and of two materials the calibration process reduces to the well-known empirical cupping correction (ECC) method and the empirical dual energy calibration (EDEC) method, respectively. If more than two energy bins are measured, EMEC is a generalization of the EDEC idea. Results of simulations with four and five energy bins and four basis materials show the high image quality achieved with EMEC and prove the ability of EMEC to quantify the decomposition quality of the imaging system for each basis material.
Keywords
calibration; computerised tomography; Compton effect; K-edges; calibration phantom; dual energy imaging; empirical cupping correction; empirical multiple energy calibration; energy bins; material-selective CT; multiple energy CT; photo effect images; photon-counting energy-selective X-ray detectors; Atmospheric measurements; Computed tomography; Energy measurement; Materials; Particle measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
Conference_Location
Valencia
ISSN
1082-3654
Print_ISBN
978-1-4673-0118-3
Type
conf
DOI
10.1109/NSSMIC.2011.6153810
Filename
6153810
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