DocumentCode :
3343092
Title :
Properties of reactively sputtered ZnTe:N and its use in recombination junctions
Author :
Drayton, J. ; Taylor, C. ; Gupta, A. ; Bohn, R.G. ; Rich, G. ; Compaan, A.D. ; McCandless, B.E. ; Rose, D.
Author_Institution :
Dept. of Phys. & Astron., Toledo Univ., OH, USA
fYear :
2002
fDate :
19-24 May 2002
Firstpage :
539
Lastpage :
542
Abstract :
Reactively sputtered ZnTe:N is a close valence-band match to CdTe, transparent below 2.2 eV and therefore an attractive candidate for a back contact/tunnel junction in tandem cells using CdTe or CdZnTe top cells. We report on measurements of the optical emission spectra of N2 during reactive sputtering as part of the doping optimization. For materials characterization, a series of films produced with various N2/Ar gas ratios were studied by x-ray diffraction (XRD), atomic force microscopy (AFM), Raman spectroscopy, optical absorption, variable angle spectroscopic ellipsometry (VASE), and the Hall effect. For transparent back contact fabrication, we used a ZnTe:N/ZnO:Al recombination junction bilayer.
Keywords :
Hall effect; II-VI semiconductors; Raman spectra; X-ray diffraction; atomic force microscopy; ellipsometry; semiconductor doping; semiconductor growth; semiconductor junctions; semiconductor thin films; solar cells; sputtered coatings; transparency; valence bands; zinc compounds; 2.2 eV; AFM; CdTe; CdTe top cells; CdZnTe; CdZnTe top cells; Hall effect; N2; N2 optical emission spectra; N2-Ar; N2/Ar gas ratios; Raman spectroscopy; XRD; ZnTe:N; ZnTe:N-ZnO:Al; ZnTe:N/ZnO:Al recombination junction bilayer; atomic force microscopy; back contact/tunnel junction; doping optimization; materials characterization; optical absorption; reactively sputtered ZnTe:N films; recombination junctions; solar cells; tandem cells; transparent back contact fabrication; valence-band match; variable angle spectroscopic ellipsometry; x-ray diffraction; Atom optics; Atomic force microscopy; Doping; Optical films; Optical materials; Optical microscopy; Raman scattering; Spectroscopy; Sputtering; Stimulated emission;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
ISSN :
1060-8371
Print_ISBN :
0-7803-7471-1
Type :
conf
DOI :
10.1109/PVSC.2002.1190621
Filename :
1190621
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3343092
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