Title :
Electron-beam diagnostics for Jefferson Lab´s high power free electron laser
Author :
Krafft, G.A. ; Jordan, K. ; Kehne, D. ; Benson, S. ; Denard, J. ; Feldl, E. ; Piot, P. ; Song, J. ; Ursic, R.
Author_Institution :
Thomas Jefferson Nat. Accel. Facility, Newport News, VA, USA
Abstract :
In this paper the current plans for the diagnostic complement for Jefferson Lab´s IRFEL are presented. Diagnostic devices include optical transition radiation beam viewers, both stripline and button beam position monitors, multislit beam emittance measuring devices, coherent synchrotron and transition radiation bunch length monitoring devices, and synchrotron light cameras for measuring the beam profile at high average power. Most devices have update rates of order 1 sec or shorter, and all are controlled through an EPICS control system
Keywords :
electron accelerators; free electron lasers; linear accelerators; particle beam diagnostics; synchrotron radiation; transition radiation; EPICS control system; IRFEL; Jefferson Lab; beam profile; bunch length monitoring; button beam position monitor; coherent synchrotron; electron-beam diagnostics; high power free electron laser; multislit beam emittance measurement; optical transition radiation beam viewers; stripline beam position monitor; synchrotron light cameras; transition radiation; Control systems; Length measurement; Optical beams; Optical devices; Position measurement; Power measurement; Radiation monitoring; Stimulated emission; Stripline; Synchrotron radiation;
Conference_Titel :
Particle Accelerator Conference, 1997. Proceedings of the 1997
Conference_Location :
Vancouver, BC
Print_ISBN :
0-7803-4376-X
DOI :
10.1109/PAC.1997.749879
