• DocumentCode
    3343686
  • Title

    Role of buffer layers in CIS-based solar cells

  • Author

    Olsen, L.C. ; Kundu, Sambhu

  • Author_Institution
    Washington State Univ./Tri-Cities, Richland, WA, USA
  • fYear
    2002
  • fDate
    19-24 May 2002
  • Firstpage
    652
  • Lastpage
    655
  • Abstract
    This paper describes investigations of the effects of buffer layers on CIGSS-based solar cells. Two general types of cells have been investigated, namely, direct ZnO devices and cells with either a CdS or i-ZnO buffer layer. The CIGSS absorber in all cases is Siemens Solar material. The CdS buffer layers were grown by CBD at Siemens Solar, and the i-ZnO buffer layers were grown by MOCVD at WSU. Typical efficiencies for the three types of cells were; 7 to 9 % for direct ZnO/CIGSS structures; 11 to 14 % for cells with CdS or i-ZnO buffer layers. Characterization studies included current-voltage analysis to identify current loss mechanisms, and SIMS depth concentration profiles. These studies indicate that a key purpose of the buffer layer is to provide a barrier to diffusion of impurities into the absorber.
  • Keywords
    II-VI semiconductors; cadmium compounds; copper compounds; diffusion barriers; doping profiles; gallium compounds; indium compounds; secondary ion mass spectra; semiconductor device measurement; solar cells; ternary semiconductors; zinc compounds; 11 to 14 percent; 7 to 9 percent; CBD; CIGSS-based solar cells; CIS-based solar cells; CdS; CuInGa(SSe)2; MOCVD; SIMS depth concentration profiles; Siemens Solar material; ZnO; buffer layers; current loss mechanisms; current-voltage analysis; diffusion barrier; efficiency; Buffer layers; Etching; Fabrication; Human computer interaction; Impurities; Laboratories; MOCVD; Passivation; Photovoltaic cells; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
  • ISSN
    1060-8371
  • Print_ISBN
    0-7803-7471-1
  • Type

    conf

  • DOI
    10.1109/PVSC.2002.1190649
  • Filename
    1190649