• DocumentCode
    3343857
  • Title

    Characterization of full surface roughness in agricultural soils using groundbased LiDAR

  • Author

    Diaz, Juan Carlos Fernandez ; Judge, Jasmeet ; Slatton, K. Clint ; Shrestha, Ramesh ; Carter, William E. ; Bloomquist, David

  • Author_Institution
    Dept. of Civil & Coastal Eng., Univ. of Florida, Gainesville, FL, USA
  • fYear
    2010
  • fDate
    25-30 July 2010
  • Firstpage
    4442
  • Lastpage
    4445
  • Abstract
    Microwave emission and scattering models require the parametrization of surface roughness. Traditionally this has been achieved by sampling the surface in transects. In this work, roughness is characterized from 3D surface models derived from ground-based LiDAR. The dataset consist 18 surfaces with varying roughness characteristics. 2D profiles extracted from the surface model constitute the baseline to compare to traditional profiling methods. It was found that sampling using profiles produces an underestimation of the RMSh by 25-63% and an even more severe underestimation in the correlation length that can reach up to an order of magnitude difference. From the 17,178 2D extracted profiles it was determined a significant sensitivity of the roughness parameters to the detrending methods, as well as a poor fit between the experimental ACF and the exponential and Gaussian models. Finally, methodologies to detrend quasi-periodic surfaces and the decomposition of surface at different scales are proposed and illustrate the advantage of having a 3D representation.
  • Keywords
    agriculture; optical radar; remote sensing by radar; soil; surface roughness; 3D surface model; Gaussian model; agricultural soil; groundbased LiDAR; microwave emission; microwave scattering; surface roughness; Correlation; Laser radar; Rough surfaces; Soil; Surface roughness; Surface treatment; Surface waves; Laser radar; Remote sensing; Rough surfaces; Soil moisture; Soil roughness; Terrain mapping;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium (IGARSS), 2010 IEEE International
  • Conference_Location
    Honolulu, HI
  • ISSN
    2153-6996
  • Print_ISBN
    978-1-4244-9565-8
  • Electronic_ISBN
    2153-6996
  • Type

    conf

  • DOI
    10.1109/IGARSS.2010.5652056
  • Filename
    5652056