• DocumentCode
    3343929
  • Title

    Accurate extraction of simplified symbolic pole/zero expressions for large analog IC´s

  • Author

    Hsu, Jer-Jaw ; Sechen, Carl

  • Author_Institution
    Cadence Design Syst. Inc., San Jose, CA, USA
  • Volume
    3
  • fYear
    1995
  • fDate
    30 Apr-3 May 1995
  • Firstpage
    2083
  • Abstract
    We present the sifting approach and its implementation (AnalogSifter) for symbolic analysis and automatic extraction of symbolic pole and zero expressions for analog integrated circuits. Very compact symbolic expressions for the voltage gains of the two-stage CMOS, 741, and even larger operational amplifiers, were obtained in less than 40 CPU seconds on a SUN SPARCstation 2, and the simplified results match well with the exact numerical values up to the unity gain frequencies in both the magnitude and phase versus frequency plots. The symbolic pole and zero expressions are extracted accurately in the frequency range of interest. All pole and zero expressions may be extracted accurately in individual or clustered symbolic forms by scanning through different frequency ranges. The simplified symbolic pole and zero expressions we obtained in the example presented are within 3% of the exact values
  • Keywords
    CMOS analogue integrated circuits; active filters; analogue integrated circuits; circuit analysis computing; circuit stability; low-pass filters; operational amplifiers; poles and zeros; 741 op amp; AnalogSifter; SUN SPARCstation 2; active low pass filter; clustered symbolic form; large analog ICs; operational amplifiers; sifting approach; symbolic analysis; symbolic pole expressions; symbolic zero expressions; two-stage CMOS op amp; voltage gain; Analog circuits; Analog integrated circuits; Capacitors; Circuit analysis; Circuit stability; Frequency; Operational amplifiers; Poles and zeros; Rivers; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1995. ISCAS '95., 1995 IEEE International Symposium on
  • Conference_Location
    Seattle, WA
  • Print_ISBN
    0-7803-2570-2
  • Type

    conf

  • DOI
    10.1109/ISCAS.1995.523835
  • Filename
    523835