• DocumentCode
    3343966
  • Title

    Chemical treatment of semiconductor surfaces - one of the main problem of modern semiconductor material sciences

  • Author

    Toniasbik, V.M. ; Tomashik, Z.F. ; Lukiyanchuk, E.M. ; Stratiychuk, I.B.

  • fYear
    2004
  • fDate
    17-21 Oct. 2004
  • Firstpage
    45
  • Lastpage
    48
  • Abstract
    It is shown that the construction of concentration dependences of equal etching rates, surface roughness, degree of surface contamination with etchant components and reaction products, deviation from stoichiometry of the surface layers (so-called Gibbs diagrams in the case of the ternary systems) for different semiconductor compounds and based on its solid solutions give the possibility to determine the etckant composition with necessary properties. The comparison of obtained Gibbs diagrams for undoped and doped semiconductors as well as for solid solutions with difforent compositions allow to define the influence of doping or solid solution composition on the main peculiarities of the chemical treatment. Taking into account a big experience in the field of the chemical treatment oj the 1/- VI and III- V semiconductor compounds some problems which must be resolve in the future are lay down.
  • Keywords
    Chemical compounds; Etching; Pollution measurement; Rough surfaces; Semiconductor device manufacture; Semiconductor materials; Solids; Surface contamination; Surface roughness; Surface treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Devices and Microsystems, 2004. ASDAM 2004. The Fifth International Conference on
  • Conference_Location
    Smolenice Castle, Slovakia
  • Print_ISBN
    0-7803-8335-7
  • Type

    conf

  • DOI
    10.1109/ASDAM.2004.1441154
  • Filename
    1441154