• DocumentCode
    3343974
  • Title

    A Novel Compound Neural Network for Fault Diagnosis

  • Author

    Weidong, Jiao ; Shixi, Yang ; Gongbiao, Yan

  • Author_Institution
    Mech. & Electr. Eng. Dept., Jiaxing Coll.
  • fYear
    2006
  • fDate
    Aug. 2006
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Independent component analysis (ICA) is a powerful tool for redundancy reduction and nongaussian data analysis. And, artificial neural network (ANN), especially the self-organizing map (SOM) based on unsupervised learning is a kind of excellent method for pattern clustering and recognition. By combining ICA with ANN, we proposed a novel compound neural network for pattern classification. First, two neural ICA algorithms were applied to fusion of multi-channel measurements by sensors. Moreover, a unit for further feature extraction was used to capture statistical features higher than second order, which embedded into the measurements. Second, certain a typical neural classifier such as multi-layer perceptron (MLP), radial basis function (RBF) or SOM was trained for the final pattern classification. The results from contrast experiments in fault diagnosis show that the proposed compound neural network with ICA based feature extraction can classify various fault patterns at considerable accuracy, and be constructed in simpler way, both of which imply its great potential in fault diagnosis
  • Keywords
    fault diagnosis; independent component analysis; multilayer perceptrons; pattern recognition; radial basis function networks; self-organising feature maps; artificial neural network; compound neural network; fault diagnosis; independent component analysis; multilayer perceptron; neural classifier; nonGaussian data analysis; pattern classification; pattern clustering; pattern recognition; radial basis function; redundancy reduction; self-organizing map; unsupervised learning; Artificial neural networks; Data analysis; Fault diagnosis; Feature extraction; Independent component analysis; Neural networks; Pattern classification; Pattern clustering; Redundancy; Unsupervised learning; Compound neural network; Fault diagnosis; Independent component analysis; Redundancy reduction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Mechatronic and Embedded Systems and Applications, Proceedings of the 2nd IEEE/ASME International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    0-7803-9721-5
  • Type

    conf

  • DOI
    10.1109/MESA.2006.297004
  • Filename
    4077831