DocumentCode
3344058
Title
Dielectric properties of CaCu3 Ti4 O12 ceramics fabricated with high purity nanometric powders
Author
Hui Wang ; Chunjiang Lin ; Jinqiang He ; Shengtao Li
Author_Institution
State Key Lab. of Electr. Insulation & Power Equip., Xi´an Jiaotong Univ., Xi´an, China
fYear
2013
fDate
June 30 2013-July 4 2013
Firstpage
1076
Lastpage
1079
Abstract
The characteristics of raw material powders, such as the purity and average particle size, have a major impact on the microstructure and properties of the CaCu3Ti4O12 ceramics. The properties of CaCu3Ti4O12 ceramics fabricated with nano-size powders (~30 nm) are compared with those of the samples with submicron powders (0.1~0.3 μm). It is found that, the samples fabricated with nano-size powders have homogenous microstructure and stable performance, and the dielectric constant is improved by an order of magnitude. It is considered that the relaxation peak with the energy level of 0.38 eV is dominated by impurity defect which mainly originates from raw materials, because this peak disappears in the samples with high purity raw material. This research provides a technical guidance for the application of this material.
Keywords
calcium compounds; ceramics; crystal microstructure; dielectric relaxation; nanoparticles; particle size; permittivity; powders; CaCu3Ti4O12; average particle size; ceramic dielectric properties; ceramic microstructure; dielectric constant; energy level; high purity nanometric powders; high purity raw material; homogenous microstructure; impurity defect; material application; nanosize powders; raw material powder characteristics; relaxation peak; stable performance; submicron powders; Ceramics; Dielectrics; Energy states; Grain boundaries; Microstructure; Powders; Raw materials; CaCu3 Ti4 O12 ceramics; dielectric properties; nano-size powders; raw materials;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid Dielectrics (ICSD), 2013 IEEE International Conference on
Conference_Location
Bologna
ISSN
2159-1687
Print_ISBN
978-1-4799-0807-3
Type
conf
DOI
10.1109/ICSD.2013.6619877
Filename
6619877
Link To Document