DocumentCode :
3344059
Title :
Efficiency gain for Bi-facial multi-crystalline solar cell With uncapped Al2O3 and local firing-through Al-BSF
Author :
Cesar, Ivan ; Manshanden, Petra ; Janssen, G. ; Granneman, Ernst ; Siarheyeva, Olga ; Weeber, Arthur W.
Author_Institution :
ECN Solar Energy, Petten, Netherlands
fYear :
2013
fDate :
16-21 June 2013
Firstpage :
1212
Lastpage :
1217
Abstract :
The p-type bi-facial cell concept, p-PASHA (Passivated on all sides H-pattern), is developed at ECN and employs an uncapped Al2O3 passivation layer on the rear through which a screen printed H-pattern of aluminium contacts is fired. Here we report a net gain in cell efficiency of 0.2% absolute for the p-PASHA cell vs. industrial reference with the addition of a clean and an ALD step. Even higher gains up to 0.5% abs. are expected after optimization of the cell design and process. Apart from the efficiency gain, the bi-facial cell concept allows for 50-80% reduction in Al paste consumption, the use of thinner wafers, and consists of less processing steps compared to prevalent PERC concepts. The Al2O3 dielectric layer is deposited in the Levitrack, an industrial-type system for high-throughput Atomic Layer Deposition (ALD) developed by Levitech. The efficiency gain is obtained on multi-crystalline wafers, at a rear metal fraction of 40%. Localized IQE mapping, cross-sectional SEM investigation, resistance measurements and 2D simulation relate the efficiency improvement compared to our conventional process to better eutectic and BSF formation at the Al contact edges.
Keywords :
aluminium compounds; atomic layer deposition; electric resistance measurement; passivation; scanning electron microscopy; semiconductor materials; solar cells; 2D simulation; ALD step; Al2O3; ECN; Levitech; Levitrack; aluminium contact; bifacial multicrystalline solar cell; cell design optimization; cross-sectional SEM investigation; dielectric layer; high-throughput atomic layer deposition; industrial-type system; local firing-through Al-BSF; localized IQE mapping; multicrystalline wafer; p-PASHA; p-type bifacial cell concept; passivated on all sides H-pattern; prevalent PERC concept; rear metal fraction; resistance measurement; screen printed H-pattern; uncapped passivation layer; Aluminum oxide; Dielectrics; Firing; Metallization; Passivation; Photovoltaic cells; ALD; Al-BSF; Al2O3; Bi-facial; eutectic; firing-through; multi-crystalline; p-type;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
Conference_Location :
Tampa, FL
Type :
conf
DOI :
10.1109/PVSC.2013.6744358
Filename :
6744358
Link To Document :
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