Title : 
11% efficiency on CIGS superstrate solar cells without sodium precursor
         
        
            Author : 
Haug, F.-J. ; Zogg, H. ; Tiwari, A.N.
         
        
            Author_Institution : 
Lab. of Solid State Phys., Swiss Fed. Inst. of Technol., Zurich, Switzerland
         
        
        
        
        
        
            Abstract : 
Cu(In,Ga)Se2 superstrate solar cells were prepared by vacuum evaporation of the elements on glass substrates coated with a ZnO/ZnO:Al bi-layer. Large grain size in the Cu(In,Ga)Se2 layer was obtained with a modified three stage process while no additional source of sodium was used. As deposited devices showed a low fill factor due to a voltage dependent carrier collection. The fill factor and the open circuit voltage improved considerably upon light soaking. Efficiencies of up to 11.2% have been obtained. The capacitance voltage characteristics reveal a low effective carrier density in Cu(In,Ga)Se2 of about 1.1014 cm-3 for as-deposited cells. Light soaked cells show an increase in the carrier density by one order of magnitude which gives rise to a higher open circuit voltage. Additionally, measurements of the spectral response show an enhanced carrier collection under forward bias conditions.
         
        
            Keywords : 
carrier density; copper compounds; gallium compounds; grain size; indium compounds; semiconductor device measurement; solar cells; ternary semiconductors; vacuum deposited coatings; 11 percent; CIGS superstrate solar cells; Cu(InGa)Se2; ZnO-ZnO:Al; capacitance voltage characteristics; carrier collection; carrier density; efficiency; fill factor; forward bias conditions; grain size; light soaking; open circuit voltage; spectral response; three stage process; vacuum evaporation; voltage dependent carrier collection; Charge carrier density; Circuits; Conductivity; Glass; Grain size; Photovoltaic cells; Physics; Substrates; Voltage; Zinc oxide;
         
        
        
        
            Conference_Titel : 
Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
         
        
        
            Print_ISBN : 
0-7803-7471-1
         
        
        
            DOI : 
10.1109/PVSC.2002.1190668