• DocumentCode
    3344285
  • Title

    Interface properties of CIGS(s)/buffer layers formed by the Cd-partial electrolyte process

  • Author

    Johnson, P.K. ; Pudov, A.O. ; Sites, J.R. ; Ramanathan, K. ; Hasoon, F.S. ; Tarrant, D.E.

  • Author_Institution
    Dept. of Phys., Colorado State Univ., Fort Collins, CO, USA
  • fYear
    2002
  • fDate
    19-24 May 2002
  • Firstpage
    764
  • Lastpage
    767
  • Abstract
    A chemical-bath treatment that does not form a CdS layer has been used on CIGS absorbers made at the National Renewable Energy Laboratory (NREL). The resultant cells have moderate to high efficiency, with improved current collection at shorter wavelengths. Room temperature quantum efficiency (QE) and capacitance-voltage (CV) results indicate that the different surface treatments yield electro-optical differences in the bulk of the absorber. Room temperature current density-voltage (JV) and AMPS modeling results are used to compare and contrast the results of the surface treatments, primarily from the NREL devices.
  • Keywords
    cadmium compounds; capacitance; current density; gallium compounds; indium compounds; solar cells; surface treatment; ternary semiconductors; AMPS modeling; CIGS absorbers; CIGSS buffer layers; Cd-partial electrolyte process; Cu(InGa)Se2; CuInxGa1-xSeyS2-y; NREL; National Renewable Energy Laboratory; capacitance-voltage results; chemical-bath treatment; current collection; current density-voltage; electro-optical differences; interface properties; moderate to high efficiency; room temperature quantum efficiency; shorter wavelengths; surface treatments; Buffer layers; Capacitance measurement; Capacitance-voltage characteristics; Chemical industry; Frequency measurement; Laboratories; Renewable energy resources; Surface treatment; Temperature; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
  • ISSN
    1060-8371
  • Print_ISBN
    0-7803-7471-1
  • Type

    conf

  • DOI
    10.1109/PVSC.2002.1190677
  • Filename
    1190677