• DocumentCode
    3344305
  • Title

    MCM Interconnect Test Scheme Based on Ant Colony Algorithm and Particle Swarm Optimization Algorithm

  • Author

    Lei, Chen ; Xia, Zhu

  • Author_Institution
    Coll. of Comput. & Control, Guilin Univ. of Electron. Technol., Guilin, China
  • fYear
    2009
  • fDate
    14-17 Oct. 2009
  • Firstpage
    678
  • Lastpage
    681
  • Abstract
    A novel scheme based on ant colony algorithm (ACA) and particle swarm optimization (PSO) algorithm is proposed for Multi-chip Module (MCM) interconnect test generation in this paper. By combing the characteristics of MCM interconnect test, the velocity updating equation and position updating equation of PSO is designed for automatic test generation. PSO generates the initial candidate test vectors. Employing the pheromone-updating rule and state transition rule, ACA evolves these initial candidates. The international standard MCM benchmark circuit provided by the MCNC group was used to verify the approach. Simulation results show that the approach can achieve high fault coverage and compact test set, comparing with the evolutionary algorithms and the deterministic algorithms.
  • Keywords
    integrated circuit interconnections; multichip modules; particle swarm optimisation; MCM interconnect test scheme; ant colony algorithm; automatic test generation; multi-chip module interconnect test generation; particle swarm optimization algorithm; Automatic testing; Benchmark testing; Character generation; Circuit faults; Circuit simulation; Circuit testing; Equations; Evolutionary computation; Integrated circuit interconnections; Particle swarm optimization; Multi-chip Module; ant colony algorithm; particle swarm optimization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Genetic and Evolutionary Computing, 2009. WGEC '09. 3rd International Conference on
  • Conference_Location
    Guilin
  • Print_ISBN
    978-0-7695-3899-0
  • Type

    conf

  • DOI
    10.1109/WGEC.2009.114
  • Filename
    5402744