DocumentCode
3344305
Title
MCM Interconnect Test Scheme Based on Ant Colony Algorithm and Particle Swarm Optimization Algorithm
Author
Lei, Chen ; Xia, Zhu
Author_Institution
Coll. of Comput. & Control, Guilin Univ. of Electron. Technol., Guilin, China
fYear
2009
fDate
14-17 Oct. 2009
Firstpage
678
Lastpage
681
Abstract
A novel scheme based on ant colony algorithm (ACA) and particle swarm optimization (PSO) algorithm is proposed for Multi-chip Module (MCM) interconnect test generation in this paper. By combing the characteristics of MCM interconnect test, the velocity updating equation and position updating equation of PSO is designed for automatic test generation. PSO generates the initial candidate test vectors. Employing the pheromone-updating rule and state transition rule, ACA evolves these initial candidates. The international standard MCM benchmark circuit provided by the MCNC group was used to verify the approach. Simulation results show that the approach can achieve high fault coverage and compact test set, comparing with the evolutionary algorithms and the deterministic algorithms.
Keywords
integrated circuit interconnections; multichip modules; particle swarm optimisation; MCM interconnect test scheme; ant colony algorithm; automatic test generation; multi-chip module interconnect test generation; particle swarm optimization algorithm; Automatic testing; Benchmark testing; Character generation; Circuit faults; Circuit simulation; Circuit testing; Equations; Evolutionary computation; Integrated circuit interconnections; Particle swarm optimization; Multi-chip Module; ant colony algorithm; particle swarm optimization;
fLanguage
English
Publisher
ieee
Conference_Titel
Genetic and Evolutionary Computing, 2009. WGEC '09. 3rd International Conference on
Conference_Location
Guilin
Print_ISBN
978-0-7695-3899-0
Type
conf
DOI
10.1109/WGEC.2009.114
Filename
5402744
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