• DocumentCode
    3344346
  • Title

    An electrical aging model including Kramers friction, phonon vibrations and electrostriction

  • Author

    Crine, Jean-Pierre

  • Author_Institution
    Retired, St.-Bruno, QC, Canada
  • fYear
    2013
  • fDate
    June 30 2013-July 4 2013
  • Firstpage
    283
  • Lastpage
    286
  • Abstract
    In this paper, we show that the field-induced electromechanical stress cannot be the Maxwell stress, as we had assumed in former models. In fact, high field electrical aging seems to be another case of electrostriction. This does not change the more or less linear relation between log time and the square of the applied field but the activation volume (i.e. the inverse of the broken C-C bonds concentration) is significantly smaller. The activation energy is composed of several terms (as previously discussed) including the C-C bonds strength, the phonons free energy associated with molecular relaxations and a configurational entropy change. Below the isokinetic temperature of the given relaxation, a Kramers friction term must also be added. It also appears that at low fields the configurational entropy change is decreasing with increasing field up to the so-called threshold field. Further work is suggested.
  • Keywords
    ageing; bonds (chemical); dielectric relaxation; electrostriction; entropy; free energy; friction; phonons; C-C bond strength; Kramers friction term; activation energy; activation volume; applied field; configurational entropy change; electrical aging model; electrostriction; field-induced electromechanical stress; high field electrical aging; molecular relaxations; phonon free energy; phonon vibrations; relaxation isokinetic temperature; threshold field; Aging; Electrostriction; Friction; Plastics; Positron emission tomography; Strain; Stress; Kramers rate theory; aging; bonds breaking; electrostriction; polymers; relaxations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid Dielectrics (ICSD), 2013 IEEE International Conference on
  • Conference_Location
    Bologna
  • ISSN
    2159-1687
  • Print_ISBN
    978-1-4799-0807-3
  • Type

    conf

  • DOI
    10.1109/ICSD.2013.6619892
  • Filename
    6619892