Title :
Analysis of the microstructure of silicon quantum dot superlattice embedded microcrystalline silicon carbide for solar cell application
Author :
Chaudhuri, P. ; Kole, Arindam ; Haider, Golam
Author_Institution :
Indian Assoc. for the Cultivation of Sci., Kolkata, India
Abstract :
We have recently demonstrated [1] p-i-n structure diodes with the intrinsic (i) layers comprising of periodic depositions of silicon quantum dot embedded microcrystalline silicon carbide and silicon rich microcrystalline silicon carbide layers by rf (13.56 MHz) plasma enhanced chemical vapour deposition method. The rf power was toggled between 80 mW/cm3 and 40 mW/cm3 in successive layers. The high power layer (HPL) contains silicon nanocrystallites which forms a layer of silicon quantum dots in HPL having thickness within the limit of silicon excitonic Bohr radius (~5nm). The low power layer (LPL) forms a silicon rich microcrystalline silicon carbide layer when thickness is large but becomes nearly amorphous at low thicknesses. By optimizing the layer thicknesses of HPL and LPL the interaction between the quantum dots in alternate HPL layers gave rise to the formation of an intermediate band gap resulting in good photovoltaic properties of the diode. In this paper we report an analysis of the ellipsometric data of a series of the multilayered samples of HPL having thickness at 5 nm and LPL thickness controlled between 13 nm and 2 nm to observe the evolution of the microstructure near the formation of the intermediate band. The imaginary part of the pseudodielectric function data of the multilayered samples obtained from ellipsometry have been fitted with the help of effective medium approximation method using the respective microcrystalline silicon carbide films i.e. HPL or LPL together with the phase separated poly silicon and voids as the reference materials for modeling, we observe that the volume fraction of the nanocrystalline silicon increases while the void fraction decreases within the superlattice with the lowering of the LPL thickness from 13 nm to 2 nm. These data are consistent with the evolution of the short range order within the multilayer samples and may serve as a guideline for designing the silicon quantum dot based solar cel- s.
Keywords :
amorphous semiconductors; crystal microstructure; dielectric function; elemental semiconductors; ellipsometry; energy gap; excitons; multilayers; p-i-n diodes; plasma CVD; semiconductor quantum dots; semiconductor thin films; silicon; silicon compounds; solar cells; superlattices; wide band gap semiconductors; LPL thickness; PL layers; Si-SiC; effective medium approximation method; ellipsometric data; ellipsometry; high power layer; intermediate band formation; intermediate band gap formation; low power layer; microstructure analysis; microstructure evolution; multilayer samples; multilayered samples; p-i-n structure diodes; phase separated polysilicon; photovoltaic properties; plasma enhanced chemical vapour deposition method; rf power; silicon excitonic Bohr radius; silicon nanocrystallites; silicon quantum dot based solar cells; silicon quantum dot superlattice embedded microcrystalline silicon carbide; silicon rich microcrystalline silicon carbide layer; silicon rich microcrystalline silicon carbide layers; void fraction; Ellipsometry; Photovoltaic cells; Quantum dots; Silicon; Silicon carbide; Superlattices; microcrystalline silicon carbide; photovoltaic cells; silicon quantum dot superlattice;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
Conference_Location :
Tampa, FL
DOI :
10.1109/PVSC.2013.6744389