• DocumentCode
    334486
  • Title

    Analysis of the measurement uncertainty associated with 1/R extrapolation of radiated emission measurements on an open area test site (OATS)

  • Author

    Gisin, Franz ; Pantic-Tanner, Zorica

  • Author_Institution
    Silicon Graphics Inc., Mountain View, CA, USA
  • Volume
    1
  • fYear
    1998
  • fDate
    24-28 Aug 1998
  • Firstpage
    137
  • Abstract
    Radiated emission measurements made on an open area test site (OATS) are often made at distances other than that associated with the specification limit. In such cases, the measured value is extrapolated to the limit distance using an inverse linear-distance extrapolation factor, 1/R. However, this extrapolation is not accurate on an OATS, where the ground plane introduces reflections that result in distance losses that do not follow a 1/R relationship. In such cases, the linear extrapolation introduces a measurement error that affects the overall accuracy of the measurement. This paper analyzes the sources of these errors, and shows that this error is dependent on the frequency, polarization, and height of the source above the ground plane. Based on the analysis, an estimate of the measurement uncertainty associated with distance extrapolation is derived
  • Keywords
    electric field measurement; electromagnetic interference; magnetic field measurement; measurement errors; measurement uncertainty; test facilities; 1/R extrapolation; distance losses; ground plane; inverse linear-distance extrapolation factor; linear extrapolation; measurement error; measurement uncertainty analysis; open area test site; polarization; radiated emission measurements; reflections; Area measurement; Electric variables measurement; Estimation error; Extrapolation; Frequency estimation; Frequency measurement; Measurement uncertainty; Open area test sites; Polarization; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1998. 1998 IEEE International Symposium on
  • Conference_Location
    Denver, CO
  • Print_ISBN
    0-7803-5015-4
  • Type

    conf

  • DOI
    10.1109/ISEMC.1998.750074
  • Filename
    750074