Title :
Planar hall effect and inagnetoresistance in hall sensors
Author :
Morvic, M. ; Betko, J.
Keywords :
Conductivity; Gallium arsenide; Geometry; Hall effect; Magnetic field measurement; Magnetic sensors; Magnetoresistance; Thickness measurement; Turning; Voltage;
Conference_Titel :
Advanced Semiconductor Devices and Microsystems, 2004. ASDAM 2004. The Fifth International Conference on
Print_ISBN :
0-7803-8335-7
DOI :
10.1109/ASDAM.2004.1441211