DocumentCode
334505
Title
TEM cell mode excitation as a function of DUT harness wire number
Author
Slattery, Kevin ; Neal, Jeffrey
Author_Institution
Ricardo North American, Madison, AL, USA
Volume
1
fYear
1998
fDate
24-28 Aug 1998
Firstpage
276
Abstract
This paper describes a series of measurements that show TEM cell resonances as a function of the number of wires populating a DUT harness. Due to DUT interaction with the TEM cell over certain frequency ranges, an uncertainty had been introduced into the test data: was the DUT susceptible, or was the DUT interacting with the test fixture? This led to a question concerning whether the DUT harness was properly decoupled at the point of entry to the TEM cell. A series of measurements were made with varying lengths of wire and varying wire count in order to determine what factors led to field enhancement in the test region
Keywords
electric field measurement; magnetic field measurement; test facilities; wires (electric); DUT harness decoupling; DUT harness wire number; TEM cell mode excitation; TEM cell resonances; field enhancement; test region; uncertainty; wire count; Connectors; Filters; Fixtures; Frequency measurement; Length measurement; Probes; Resonance; TEM cells; Testing; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 1998. 1998 IEEE International Symposium on
Conference_Location
Denver, CO
Print_ISBN
0-7803-5015-4
Type
conf
DOI
10.1109/ISEMC.1998.750100
Filename
750100
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