• DocumentCode
    334505
  • Title

    TEM cell mode excitation as a function of DUT harness wire number

  • Author

    Slattery, Kevin ; Neal, Jeffrey

  • Author_Institution
    Ricardo North American, Madison, AL, USA
  • Volume
    1
  • fYear
    1998
  • fDate
    24-28 Aug 1998
  • Firstpage
    276
  • Abstract
    This paper describes a series of measurements that show TEM cell resonances as a function of the number of wires populating a DUT harness. Due to DUT interaction with the TEM cell over certain frequency ranges, an uncertainty had been introduced into the test data: was the DUT susceptible, or was the DUT interacting with the test fixture? This led to a question concerning whether the DUT harness was properly decoupled at the point of entry to the TEM cell. A series of measurements were made with varying lengths of wire and varying wire count in order to determine what factors led to field enhancement in the test region
  • Keywords
    electric field measurement; magnetic field measurement; test facilities; wires (electric); DUT harness decoupling; DUT harness wire number; TEM cell mode excitation; TEM cell resonances; field enhancement; test region; uncertainty; wire count; Connectors; Filters; Fixtures; Frequency measurement; Length measurement; Probes; Resonance; TEM cells; Testing; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1998. 1998 IEEE International Symposium on
  • Conference_Location
    Denver, CO
  • Print_ISBN
    0-7803-5015-4
  • Type

    conf

  • DOI
    10.1109/ISEMC.1998.750100
  • Filename
    750100