Intelligent sensor structure for tilt measure

There is described approach to the development of functional and system model of the structure. In the paper, there is described a concept of structure of an intelligent sensor system for tilt measurement. Principle of an accelerometer is used for the measurement. The paper describes conceptual approach to the design of a tilt structure determined for integration on a chip. An accelerometer for measurement of inclination in x and y axes is used as a sensor. For construction non-standard connection with accelerometer is used. Measurement is controlled by a microprocessor. measured data are sent to a PC via RS232. The PC is used for data storage, further calculations and display of measured tilt. A hardware model has been developed for verification of properties. Model properties have been simulated using simulators of electronic circuits. The sensor system is temperature compensated. Lab View development tool is utilized for service program.