A study of design for improved EMI in a chip level

Author

Ham, Seog-heon ; Yun, Young-hwan ; Kim, Soo-hyung ; Lee, Yong-Hee

Author_Institution

Syst. LSI Bus., Samsung Electron., Kyungki, South Korea

Volume

1

fYear

1998

fDate

24-28 Aug 1998

Firstpage

547

Abstract

Overall EMI level of keyboard controlled IC has been improved to the level of satisfaction in the specification, which is believed to be the first time in the chip level. The ground-to-power line decoupling capacitance, the output RC filtering (or capacitance alone), and the formation of microstrip line have shown to be possible solutions for suppressing EMI characteristics in the chip level. The output RC filtering has resulted to satisfy the specification of FCC the most. The electric field peak and average value was improved to 8.8 dB and 3.1 dB respectively

Keywords

capacitance; electromagnetic interference; integrated circuit design; interference suppression; microstrip lines; EMC; EMI suppression; chip level; electric field peak; electromagnetic compatibility; ground-to-power line decoupling capacitance; keyboard controlled IC; microstrip line; output RC filtering; Capacitance; Circuit testing; Cities and towns; Electromagnetic interference; FCC; Filtering; Keyboards; Large scale integration; Microstrip filters; Semiconductor device measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 1998. 1998 IEEE International Symposium on

Conference_Location

Denver, CO

Print_ISBN

0-7803-5015-4

Type

conf

DOI

10.1109/ISEMC.1998.750153

Filename

750153