Title :
A study of design for improved EMI in a chip level
Author :
Ham, Seog-heon ; Yun, Young-hwan ; Kim, Soo-hyung ; Lee, Yong-Hee
Author_Institution :
Syst. LSI Bus., Samsung Electron., Kyungki, South Korea
Abstract :
Overall EMI level of keyboard controlled IC has been improved to the level of satisfaction in the specification, which is believed to be the first time in the chip level. The ground-to-power line decoupling capacitance, the output RC filtering (or capacitance alone), and the formation of microstrip line have shown to be possible solutions for suppressing EMI characteristics in the chip level. The output RC filtering has resulted to satisfy the specification of FCC the most. The electric field peak and average value was improved to 8.8 dB and 3.1 dB respectively
Keywords :
capacitance; electromagnetic interference; integrated circuit design; interference suppression; microstrip lines; EMC; EMI suppression; chip level; electric field peak; electromagnetic compatibility; ground-to-power line decoupling capacitance; keyboard controlled IC; microstrip line; output RC filtering; Capacitance; Circuit testing; Cities and towns; Electromagnetic interference; FCC; Filtering; Keyboards; Large scale integration; Microstrip filters; Semiconductor device measurement;
Conference_Titel :
Electromagnetic Compatibility, 1998. 1998 IEEE International Symposium on
Conference_Location :
Denver, CO
Print_ISBN :
0-7803-5015-4
DOI :
10.1109/ISEMC.1998.750153
