Title :
An accurate probe based measurement method of enclosure design for EMI containment
Author :
Sorenson, Tom ; Sullivan, Cornelius B O
Author_Institution :
Dept. of Electron. & Comput. Eng., Limerick Univ., Ireland
Abstract :
The increased radiation from apertures that occurs when enclosures resonate at the same frequency as one of the sources or a harmonic of the source(s) which are within the enclosure can make it very difficult to meet electromagnetic compatibility emissions standards. Simple experimental bench top techniques for alleviating this potential problem at the design stages of product development are described
Keywords :
electromagnetic compatibility; electromagnetic interference; packaging; probes; product development; standards; EM emissions standards; EMC; EMI; EMI containment; bench top techniques; design stages; electromagnetic compatibility; enclosure design; measurement accuracy; probe measurement method; product development; Apertures; Coupling circuits; Design methodology; Electromagnetic interference; Magnetic fields; Magnetic resonance; Probes; RLC circuits; Resonant frequency; Voltage;
Conference_Titel :
Electromagnetic Compatibility, 1998. 1998 IEEE International Symposium on
Conference_Location :
Denver, CO
Print_ISBN :
0-7803-5015-4
DOI :
10.1109/ISEMC.1998.750158
