DocumentCode
3345521
Title
Comparison of substrate finishes for flip chip packages
Author
Bansal, Anurag ; Yoon, Sam ; Xie, John ; Li, Yuan ; Mahadev, Vadali
Author_Institution
Altera Corp., San Jose, CA, USA
fYear
2005
fDate
31 May-3 June 2005
Firstpage
30
Abstract
In order to achieve substrate routing densities required for high pin count flip chip package, electroless nickel immersion gold (ENIG) substrates have been the technology of choice. However, ENIG substrates are found to be more susceptible to brittle fracture at the nickel to intermetallic interface during high strain rate events. This mode has been sporadically found in PCB assembly and handling operations involving excessive and uncontrolled flexural loads on the PC boards. The unpredictable nature of this failure mode has driven suppliers to look for alternatives to ENIG. In this paper, electrolytic nickel-gold and solder on pad (SOP) are studied and contrasted against ENIG. A significant outcome of this work is the identification of a viable surface finish with improved toughness to withstand mechanical shocks in early assembly and with continued good long term reliability.
Keywords
ball grid arrays; flip-chip devices; reliability; substrates; surface finishing; electroless nickel immersion gold substrate; flexural loads; flip chip packages; intermetallic interface; reliability; solder on pad; strain; substrate finish; substrate routing; Assembly; Capacitive sensors; Electric shock; Flip chip; Gold; Intermetallic; Nickel; Packaging; Routing; Surface finishing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2005. Proceedings. 55th
ISSN
0569-5503
Print_ISBN
0-7803-8907-7
Type
conf
DOI
10.1109/ECTC.2005.1441241
Filename
1441241
Link To Document