• DocumentCode
    3345521
  • Title

    Comparison of substrate finishes for flip chip packages

  • Author

    Bansal, Anurag ; Yoon, Sam ; Xie, John ; Li, Yuan ; Mahadev, Vadali

  • Author_Institution
    Altera Corp., San Jose, CA, USA
  • fYear
    2005
  • fDate
    31 May-3 June 2005
  • Firstpage
    30
  • Abstract
    In order to achieve substrate routing densities required for high pin count flip chip package, electroless nickel immersion gold (ENIG) substrates have been the technology of choice. However, ENIG substrates are found to be more susceptible to brittle fracture at the nickel to intermetallic interface during high strain rate events. This mode has been sporadically found in PCB assembly and handling operations involving excessive and uncontrolled flexural loads on the PC boards. The unpredictable nature of this failure mode has driven suppliers to look for alternatives to ENIG. In this paper, electrolytic nickel-gold and solder on pad (SOP) are studied and contrasted against ENIG. A significant outcome of this work is the identification of a viable surface finish with improved toughness to withstand mechanical shocks in early assembly and with continued good long term reliability.
  • Keywords
    ball grid arrays; flip-chip devices; reliability; substrates; surface finishing; electroless nickel immersion gold substrate; flexural loads; flip chip packages; intermetallic interface; reliability; solder on pad; strain; substrate finish; substrate routing; Assembly; Capacitive sensors; Electric shock; Flip chip; Gold; Intermetallic; Nickel; Packaging; Routing; Surface finishing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2005. Proceedings. 55th
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-8907-7
  • Type

    conf

  • DOI
    10.1109/ECTC.2005.1441241
  • Filename
    1441241