DocumentCode :
3345796
Title :
Deposition of microcrystalline silicon films and solar cells via the pulsed PECVD technique
Author :
Morrison, Scott ; Das, Ujjwal K. ; Madan, Arun
Author_Institution :
MVSystems Inc., Golden, CO, USA
fYear :
2002
fDate :
19-24 May 2002
Firstpage :
1102
Lastpage :
1105
Abstract :
The pulsed plasma CVD technique has been shown to increase the deposition rate without an increase in the particulate count in the plasma which is an important factor in determining the yield of commercial products such as solar cell modules. The technique is also more easily scaled to larger areas than the VHF-PECVD technique. In this paper, we report on the deposition of microcrystalline silicon (μc-Si) films over large area substrates (30 cm × 40 cm) as well on the optimization of μc-Si solar cell devices. The effects of nucleation and substrate pre-treatment on the p/i interface are discussed.
Keywords :
elemental semiconductors; nucleation; plasma CVD; plasma CVD coatings; semiconductor thin films; silicon; solar cells; Si; deposition rate; device optimization; microcrystalline silicon films; nucleation; p/i interface; pulsed PECVD; pulsed plasma CVD; solar cells; substrate pre-treatment effects; Conducting materials; Photovoltaic cells; Plasma applications; Plasma materials processing; Plasma properties; Radio frequency; Semiconductor films; Silicon; Substrates; X-ray diffraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
ISSN :
1060-8371
Print_ISBN :
0-7803-7471-1
Type :
conf
DOI :
10.1109/PVSC.2002.1190798
Filename :
1190798
Link To Document :
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