Title : 
FSDR16 a low noise, fast silicon strip detector readout IC with a 5th order complex shaping amplifier in 180 nm CMOS
         
        
            Author : 
Kleczek, R. ; Grybos, P.
         
        
            Author_Institution : 
AGH Univ. of Sci. & Technol., Cracow, Poland
         
        
        
        
        
        
            Abstract : 
We report on the design and performance of an ASIC named FSDR16 dedicated for readout of silicon strip detectors. The FSDR16 chip contains 16 channels with the size of 60μm × 880μm. Each channel contains a charge sensitive amplifier, a pole-zero cancellation circuit, a 5th order complex pulse shaping amplifier stage based on a follow-the-leader filter architecture, 7-bit trim DAC for offset correction and 8-bit shift register. The designed readout front-end system characterizes low power dissipation P = 2.5mW per single channel. The peaking time tp of the shaper is set to 100 ns or 200 ns. The complex shaper architecture allows to obtain a shorter pulse width (the pulse width to peaking time is only t0.01/tp = 2.86) than in the case of standard CR-(RC)5 (t0.01/tp = 3.46) filter, and to operate with a higher rate of input pulses. Equivalent Noise Charge of the front-end channel is equal to 254e- rms for tp = 100 ns and 184e- rms for tp = 200 ns.
         
        
            Keywords : 
CMOS integrated circuits; application specific integrated circuits; nuclear electronics; readout electronics; semiconductor counters; 5th order complex shaping amplifier; 7-bit trim DAC; 8-bit shift register; ASIC; CMOS; FSDR16; charge sensitive amplifier; equivalent noise charge; fast silicon strip detector readout IC; follow-the-leader filter architecture; offset correction; pole zero cancellation circuit; power dissipation; silicon strip detectors; Resistors;
         
        
        
        
            Conference_Titel : 
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
         
        
            Conference_Location : 
Valencia
         
        
        
            Print_ISBN : 
978-1-4673-0118-3
         
        
        
            DOI : 
10.1109/NSSMIC.2011.6153982