• DocumentCode
    3346278
  • Title

    AMPS modeling of nanocrystalline Si p-layer in a-Si nip solar cells

  • Author

    Liao, X.B. ; Wang, W. ; Deng, X.

  • Author_Institution
    Dept. of Phys. & Astron., Toledo Univ., OH, USA
  • fYear
    2002
  • fDate
    19-24 May 2002
  • Firstpage
    1234
  • Lastpage
    1237
  • Abstract
    . This paper reports numerical simulations for the impact of a wide bandgap p-type hydrogenated nanocrystalline silicon (nc-Si:H) on the performances of a-Si based component solar cells, using Analysis of Microelectronic and Photonic Structures (AMPS) computer model developed at Penn State University. The effects of band offset and potential barrier formed at the interfaces of player with i-layer and ITO front contact were also investigated. The simulated results show that 1) with increasing bandgap of p-nc-Si:H (Egp), the Voc increases beyond 1 V, then decreases, due to the band offset at the p/i interface, which also leads to an anomalous illuminated I-V characteristics with a bending close to the open circuit point; and 2) the front contact barrier plays a similar role to hinder the hole collection and may cause the illuminated I-V curve to bend seriously.
  • Keywords
    band structure; elemental semiconductors; hydrogen; interface states; nanostructured materials; semiconductor device models; silicon; solar cells; wide band gap semiconductors; AMPS modeling; I-V characteristics; ITO; ITO front contact; InSnO; Si:H; a-Si nip solar cells; band offset; computer model; front contact barrier; nanocrystalline Si p-layer; numerical simulations; open circuit point; performances; potential barrier; wide bandgap p-type hydrogenated nanocrystalline silicon; Circuits; Computational modeling; Indium tin oxide; Microelectronics; Numerical simulation; Optical computing; Performance analysis; Photonic band gap; Photovoltaic cells; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
  • ISSN
    1060-8371
  • Print_ISBN
    0-7803-7471-1
  • Type

    conf

  • DOI
    10.1109/PVSC.2002.1190831
  • Filename
    1190831