• DocumentCode
    3346300
  • Title

    Interface recombination in amorphous/crystalline silicon solar cells, a simulation study

  • Author

    Froitzheim, A. ; Stangl, R. ; Elstner, L. ; Schmidt, M. ; Fuhs, W.

  • Author_Institution
    Hahn-Meitner-Inst., Berlin, Germany
  • fYear
    2002
  • fDate
    19-24 May 2002
  • Firstpage
    1238
  • Lastpage
    1241
  • Abstract
    The paper presents a numerical simulation of the behavior of a-Si:H/c-Si heterojunction solar cells. The simulations address in particular the question of the role of interface recombination for the device performance. It is shown that the critical parameters are the density of interface states at the a-Si:H/c-Si heterojunction and the band bending which is determined by the band offsets and the front contact work function. It is shown that due to the more favorable band bending the structure with the p-type emitter on an n-type c-Si absorber has an intrinsic advantage over the inverse structure. The role of an undoped a-Si:H buffer layer is discussed and it is shown that the front contact TCO/a-Si:H has considerable influence on the band bending in the c-Si wafer and therefore is of crucial importance for the cell performance.
  • Keywords
    amorphous semiconductors; band structure; electron-hole recombination; elemental semiconductors; hydrogen; interface states; semiconductor device models; silicon; solar cells; Si:H-Si; amorphous/crystalline silicon solar cells; band bending; band offsets; cell performance; critical parameters; density of interface states; device performance; front contact work function; heterojunction solar cells; interface recombination; inverse structure; numerical simulation; p-type emitter; undoped a-Si:H buffer layer; Amorphous materials; Buffer layers; Crystallization; Heterojunctions; Interface states; Numerical simulation; Photovoltaic cells; Radiative recombination; Silicon; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
  • ISSN
    1060-8371
  • Print_ISBN
    0-7803-7471-1
  • Type

    conf

  • DOI
    10.1109/PVSC.2002.1190832
  • Filename
    1190832