Title :
Wafer-Level Packaging of MEMS Accelerometers with Through-Wafer Interconnects
Author :
Yun, C.H. ; Brosnihan, T.J. ; Webster, W.A. ; Villarreal, J.
fDate :
May 31 2005-June 3 2005
Keywords :
Accelerometers; Electronics packaging; Etching; Fabrication; Integrated circuit interconnections; Micromechanical devices; Oxidation; Resists; Wafer bonding; Wafer scale integration;
Conference_Titel :
Electronic Components and Technology Conference, 2005. Proceedings. 55th
Conference_Location :
Lake Buena Vista, FL
Print_ISBN :
0-7803-8907-7
DOI :
10.1109/ECTC.2005.1441285