Title :
A Boundary Scan Based Realization Method for Fault Diagnosis of Torn Analog Subnet
Author :
Jin, Cao ; Lei, Xu ; Yifei, Guo ; Ruixu, Guo
Author_Institution :
Northern Electron. Instrum. Inst., Beijing, China
Abstract :
Though the subnet tearing strategy provides a fault diagnosis method of analog circuit with high performance, the lack of efficient test isolation and stimuli generation methods are still the chief difficulties and challenges in the practical application. Aimed to solve the afore-mentioned bottle-necks, a boundary scan based realization method is proposed. In the presented method, the boundary scan\´s "Virtual Probe" and "Independency Serial Test Path" technologies are adopted and afford an opportunity to put the subnet tearing fault diagnosis strategy into practical use.
Keywords :
analogue circuits; boundary scan testing; fault diagnosis; analog circuit; boundary scan based realization method; independency serial test path technology; stimuli generation methods; subnet tearing fault diagnosis strategy; test isolation methods; torn analog subnet; virtual probe technology; Analog circuits; Circuit faults; Computer architecture; Fault diagnosis; IEEE standards; Probes; boundary scan; fault diagnosis; subnet tearing;
Conference_Titel :
Instrumentation, Measurement, Computer, Communication and Control, 2011 First International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-0-7695-4519-6
DOI :
10.1109/IMCCC.2011.51